Temperature dependence of relative permittivity and loss tangent of novel transparent substrate material at microwave frequencies

Recently a transparent dielectric substrate based on Ba(Sn,Mg,Ta)0₃ material has been developed for microwave applications. We measured the real relative permittivity of this transparent substrate at frequency of 3.2 GHz using a split post dielectric resonator technique at temperatures from 230 K to 300K, and a high resolution cryogenic post resonator at 9.20Hz from 38K to 88K. The Transmission Mode Q factor Technique was used for data processing to ensure high accuracy of the measurements. Measured values of εᵣ' and tanδ of transparent BSMTO turned out 'to be 25.2 and 3.45x 10⁻⁵ at room temperature respectively. TIle Ba(Sn,MgTa)0₃ transparent substrate may be useful for miniaturised planar antenna arrays and other microwave applicati011S where transparent substrates are needed.

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International Conference on Materials for Advanced Technologies

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981-238-372-7

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