An enhanced MOSFET threshold voltage model for the 6–300 K temperature range

Journal Publication ResearchOnline@JCU
Nguyen, Cong Dao;El Kass, Abdallah;Rahimi Azghadi, Mostafa;Jin, Craig T.;Scott, Jonathan;Leong, Philip H.W.
Mostafa Rahimi Azghadi
Abstract

An enhanced threshold voltage model for MOSFETs operating over a wide range of temperatures (6–300K) is presented. The model takes into account the carrier freeze-out effect and the external field-assisted ionization to address the temperature dependence of MOS transistors. For simplicity, an empirical function is incorporated to predict short channel effects over the temperature range. The results from the proposed model demonstrate good agreement with NMOS and PMOS transistors measured from fabricated chips.

Journal

Microelectronics Reliability

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Volume

69

ISBN/ISSN

1872-941X

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Pages Count

4

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Publisher

Elsevier

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EISSN

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DOI

10.1016/j.microrel.2016.12.007