Performance evaluation of in-circuit testing on QCA based circuits
Conference Publication ResearchOnline@JCUAbstract
Quantum-Dot Cellular automata based circuits (QCA) are one of the favorite novel technologies, which operates on binary data at the nanometer-scale; in which logical operations and data movement are accomplished via Columbic interaction rather than electric current flow leading to a very little power dissipation. Since circuits made from QCA devices could provide various "wins" over CMOS, in recent years there has been an influx of QCA-related research. However before implementing every circuit, its testability and reliability must be mentioned. Hence, testing of these devices is our main concern in this paper and we will show how to perform In-Circuit-Testing on them and the differences and difficulties which is caused by the quantum entity of these circuits.
Journal
N/A
Publication Name
EWDTS 08: IEEE East-West Design & Test Symposium
Volume
N/A
ISBN/ISSN
978-1-4244-3402-2
Edition
N/A
Issue
N/A
Pages Count
4
Location
Lviv, Ukraine
Publisher
Institute of Electrical and Electronics Engineers
Publisher Url
N/A
Publisher Location
Piscataway, NJ, USA
Publish Date
N/A
Url
N/A
Date
N/A
EISSN
N/A
DOI
10.1109/EWDTS.2008.5580138