Structural characterization of γ-terpinene thin films using mass spectroscopy and X-Ray photoelectron spectroscopy
Journal Publication ResearchOnline@JCUAbstract
Understanding the polymerization mechanism of a precursor is indispensable to enhance the requisite material properties. In situ mass spectroscopy and X-ray photoelectron spectroscopy is used in this study to understand the RF plasma polymerization of γ-terpinene. High-resolution mass spectra positive ion mass spectrometry data of the plasma phase demonstrates the presence of oligomeric species of the type [M+H]+ and [2M+H]+, where M represents a unit of the starting material. In addition, there is abundant fragmented species, with most dominant being [M+] (136 m/z), C10H13+ (133 m/z), C9H11+ (119 m/z), and C7H9+ (93 m/z). The results reported in this manuscript enables to comprehend the relationship between the degree of incorporation of oxygen and the rate of deposition with the input RF power.
Journal
Plasma Processes and Polymers
Publication Name
N/A
Volume
12
ISBN/ISSN
1612-8869
Edition
N/A
Issue
10
Pages Count
10
Location
N/A
Publisher
Wiley
Publisher Url
N/A
Publisher Location
N/A
Publish Date
N/A
Url
N/A
Date
N/A
EISSN
N/A
DOI
10.1002/ppap.201400220