Noise and charge transport in polymer thin film structures

Marinov, O.;Deen, M.J.;Yu, J.;Vamvounis, G.;Holdcroft, S.;Woods, W.

Abstract

The low frequency noise (LFN) properties of. the field-effect transistors (FETs) using polymers as the semiconducting material in thin-film transistor (TFT) structures are investigated and discussed in terms of the charge carrier transport. Results obtained from several research groups are summarized. Injection-drift limited model (IDLM) for charge transport in amorphous PFETs is discussed. IDLM has some advantages in comparison to the commonly used metal-oxide-semiconductor (MOS) transistor models. A general trend of proportionality between noise power density and the DC power applied to the polymer FET's (PFET's), channel is observed in the data from several research groups. This trend implies mobility fluctuation in PFET as the dominant noise source.

Journal

N/A

Publication Name

N/A

Volume

5113

ISBN/ISSN

1996-754X

Edition

N/A

Issue

N/A

Pages Count

Location

N/A

Publisher

SPIE

Publisher Url

N/A

Publisher Location

Bellingham, WA, USA

Publish Date

N/A

Url

N/A

Date

N/A

EISSN

N/A

DOI

10.1117/12.485990