Temperature dependence of complex permittivity of planar microwave materials
Conference Publication ResearchOnline@JCUAbstract
Fabrication of dielectric materials with low losses at microwave frequencies and stable dielectric properties under varying temperatures is an important and challenging area of research. In this paper characterisation of several planar dielectrics at microwave frequencies (~9.5 GHz) in the temperature range from 20 K to 290 K using a split post dielectric resonator has been presented. We have compared temperature stability of measured dielectric properties of RT5880, RT6010, LTCC, FR4 and Ba(MgₓTa(y))O₃ materials. Presented results are useful for selection of a material suitable for a specific application.
Journal
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Publication Name
APMC 2006 Asia Pacific Microwave Conference 2006
Volume
3
ISBN/ISSN
978-4-902339-10-9
Edition
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Issue
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Pages Count
4
Location
Yokohama, Japan
Publisher
Institute of Electronics, Information and Communication Engineers (IEICE)
Publisher Url
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Publisher Location
Japan
Publish Date
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Url
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Date
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EISSN
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DOI
10.1109/APMC.2006.4429680