Optical properties of thermally evaporated PDI-8CN2 thin films

Journal Publication ResearchOnline@JCU
Anderson, L.;Di Girolamo, F.;Barra, M.;Cassinese, A.;Jacob, M.V.
Mohan Jacob
Abstract

The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.

Journal

Physics procedia

Publication Name

Physics Procedia

Volume

14

ISBN/ISSN

1875-3892

Edition

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Issue

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Pages Count

5

Location

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Publisher

Elsevier

Publisher Url

N/A

Publisher Location

N/A

Publish Date

N/A

Url

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Date

N/A

EISSN

N/A

DOI

10.1016/j.phpro.2011.05.007