Optical properties of thermally evaporated PDI-8CN2 thin films

Journal Publication ResearchOnline@JCU
Anderson, L.;Di Girolamo, F.;Barra, M.;Cassinese, A.;Jacob, M.V.
Mohan Jacob
Abstract

The optical properties of thermally evaporated PDI-8CN2 thin films have been investigated using Variable Angle Spectroscopic Ellipsometry (VASE). These layers were deposited on SiO2 dielectric layers as a means of measuring their properties on a standard interface. Regression analysis was used to determine the optical constants (refractive index and extinction coefficient) across a bandwidth of 300 – 900 nm. Anisotropy of the films was investigated, as well as the thickness dependence of the optical constants. This paper presents the results of these investigations.

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14

ISBN/ISSN

1875-3892

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Pages Count

5

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Elsevier

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DOI

10.1016/j.phpro.2011.05.007