Recent advances in measurements of permittivity and dielectric losses at microwave frequencies

Conference Publication ResearchOnline@JCU
Krupka, Jerzy;Mazierska, Janina E.;Jacob, Mohan V.;Hartnett, John G.;Tobar, Michael E.
Mohan Jacob
Abstract

The precise microwave characterization of dielectric materials is an important issue for emerging technologies of the 21st century. In this paper recent advances in resonant techniques for permittivity and dielectric loss tangent measurements of low and medium loss dielectrics at microwave frequencies are presented.

Journal

N/A

Publication Name

Microwave and Optical Technology 2003

Volume

5445

ISBN/ISSN

978-0-8194-5368-6

Edition

N/A

Issue

N/A

Pages Count

7

Location

Ostrava, Czech Republic

Publisher

SPIE - The International Society for Optical Engineering

Publisher Url

N/A

Publisher Location

N/A

Publish Date

N/A

Url

N/A

Date

N/A

EISSN

N/A

DOI

10.1117/12.560676