Measurements of thin resistive films employing split post dielectric resonator technique

Conference Publication ResearchOnline@JCU
Krupka, Jerzy;Jacob, Mohan;Givot, Bradley L.;Derzakowski, Krzysztof
Mohan Jacob
Abstract

Split post dielectric resonators have been used for measurements of the surface resistance of thin cermet and patterned metal films deposited on a thin low loss dielectric substrate.

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MIKON 17th International Conference on Microwaves, Radar & Wireless Communications

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978-83-906662-7-3

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4

Location

Wroclaw, Poland

Publisher

IEEE

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Piscataway, NJ, USA

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