Loss tangent measurements of dielectic substrates from 15K to 300K with two resonators: investigation into accuracy issues

Conference Publication ResearchOnline@JCU
Mazierska, Janina;Jacob, Mohan V.;Ledenyov, Dimitri;Krupka, Jerzy
Mohan Jacob
Abstract

Loss tangent of medium, low and very low loss dielectric substrates (including Rogers RT Duroid 5880 and 6010.2, LaAlO3, LSAT, MgO and quartz) was measured at varying temperatures with two TE01δ dielectric resonators to ensure verification of the tests. Accuracy of the measurements has been investigated and discussed for a superconducting single post and a copper split post resonators in a temperature range from 15K to 300K

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Publication Name

Asia Pacific Microwave Conference 2005

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ISBN/ISSN

0-7803-9434-8

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Pages Count

4

Location

Suzhou, China

Publisher

IEEE

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Publisher Location

Hong Kong

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EISSN

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DOI

10.1109/APMC.2005.1606805