Precise microwave characterisation of low loss dielectrics

Conference Publication ResearchOnline@JCU
Mazierska, Janina;Krupka, Jerzy;Jacob, Mohan V.
Mohan Jacob
Abstract

Measurements of complex permittivity of low loss dielectric materials (especially anisotropic) in a wide range of temperatures still represent a challenging issue. For bulk samples Whispering Gallery Modes can be used, but planar dielectrics can only be measured using TEol1 and TE018 resonators. Accuracy of tanO measurements is also determined by accuracy in determination of unloaded Qo-factor of test fixtures. This paper presents a review of resonators, a precise technique to measure the Qo factor and measurement results of complex permittivity of several low loss dielectrics.

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Publication Name

Microwave Workshops and Exhibition MWE2005

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ISBN/ISSN

978-4-902339-07-9

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Issue

2005

Pages Count

6

Location

Yokohama, Japan

Publisher

IEICE

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Publisher Location

Japan

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