Complex permittivity measurements at viable temperatures of low loss dielectric substrates employing split post and single post dielectric resonators
Conference Publication ResearchOnline@JCUAbstract
A split post dielectric resonator in a copper enclosure and a single post dielectric resonator in a cavity with superconducting end-plates have been constructed and used for the complex permittivity measurements of single crystal substrates. (La,Sr)(Al,Ta)O3, LaAlO3, MgO and quartz substrates have been measured at temperatures from 20 K to 300 K in the split post resonator and from 15 K to 80 K in the single post resonator. The TE01δ mode resonant frequencies and unloaded Q0-factors of the empty resonators at temperature of 20 K were: 9.952 GHz and 25,000 for the split post resonator and 10.808 GHz and 240,000 for the single post resonator respectively
Journal
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Publication Name
2004 International Microwave Symposium
Volume
3
ISBN/ISSN
0-7803-8331-1
Edition
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Issue
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Pages Count
4
Location
Fort Worth, Texas, USA
Publisher
IEEE
Publisher Url
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Publisher Location
Hong Kong
Publish Date
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Url
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Date
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EISSN
N/A
DOI
10.1109/MWSYM.2004.1338959