Investigations on microwave power dependence of high quality TI-1223 thin films on LSAT substrate

Journal Publication ResearchOnline@JCU
Jacob, M.V.;Sundaresan, A.;Mazierska, J.;Tanaka, Y.
Mohan Jacob
Abstract

The microwave power dependence of high quality Tl(Ba,Sr)2Ca2Cu3Oy thin films grown on 1'' diameter LSAT substrates using the Amorphous Phase Epitaxy method has been investigated in this paper. We have performed surface resistance (RS) measurements of Tl-1223 thin films on LSAT using the Hakki-Coleman sapphire dielectric resonator technique in the temperature range 15-94 K. High accuracy in measurements was achieved by using the multi-frequency Transmission Mode Q-Factor Technique. The Tl-1223 films exhibited low surface resistance comparable to YBCO films. When RF power levels were increased the onset of nonlinearity was observed at 0 dBm for all measured temperatures (17, 50, 70 and 84 K).

Journal

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY

Publication Name

N/A

Volume

15

ISBN/ISSN

1558-2515

Edition

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Issue

2

Pages Count

4

Location

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Publisher

IEEE

Publisher Url

N/A

Publisher Location

New York, USA -NY

Publish Date

N/A

Url

N/A

Date

N/A

EISSN

N/A

DOI

10.1109/TASC.2005.849368