Precise microwave characterization of MgO substrates for HTS circuits with superconducting post dielectric resonator
Journal Publication ResearchOnline@JCUAbstract
Accurate data of complex permittivity of dielectric substrates are needed for efficient design of HTS microwave planar circuits. We have tested MgO substrates from three different manufacturing batches using a dielectric resonator with superconducting parts recently developed for precise microwave characterization of laminar dielectrics at cryogenic temperatures. The measurement fixture has been fabricated using a SrLaAlO3 post dielectric resonator with DyBa2Cu3O7 end plates and silver-plated copper sidewalls to achieve the resolution of loss tangent measurements of 2 × 10^−6. The tested MgO substrates exhibited the average relative permittivity of 9.63 and tanδ from 3.7 × 10^-7 to 2 × 10^-5 at frequency of 10.5 GHz in the temperature range from 14 to 80 K.
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Volume
18
ISBN/ISSN
1361-6668
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Issue
1
Pages Count
6
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Publisher
IOP Publishing
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Publisher Location
Bristol, United Kingdom
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DOI
10.1088/0953-2048/18/1/004