Precise microwave characterisation of YBa2Cu3O7−δ films on sapphire and lanthanum aluminate substrates
Journal Publication ResearchOnline@JCUJacob, Mohan V.;Mazierska, Janina
Abstract
We have precisely measured the surface resistance (R S) of high quality YBCO thin films, deposited on Lanthanum Aluminate and Silver doped YBCO thin films on Cesium buffered Sapphire substrates using the Hakki-Coleman dielectric resonator at frequency of 10 GHz as a function of temperature from 25 K to 85 K. We have also studied the microwave power dependence of YBCO films on both substrates and the frequency dependence of films on LAO. Precise microwave characterisation of HTS films is needed for selection of best films for mobile phone base station receivers.
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Volume
131
ISBN/ISSN
1573-7357
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Issue
3-4
Pages Count
5
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Publisher
Plenum Publishing Corporation
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Publisher Location
New York, USA -NY
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DOI
10.1023/A:1022996513221