How accurately can the surface resistance of various superconducting films be measured with the sapphire Hakki–Coleman dielectric resonator technique?

Journal Publication ResearchOnline@JCU
Mazierska, Janina;Jacob, Mohan V.
Abstract

It has been shown in the past that a random uncertainty in surface resistance measurements of HTS films as low as 1.1% can be achieved. However for comparative studies between differing samples and different laboratories the absolute uncertainty should be used instead. In this paper we discuss random and absolute uncertainties of R S measurements for three types of superconducting thin films, namely YBa2Cu3O7−δ, Tl(Ba,Sr)2Ca2Cu3Oy, and MgB2 when using an optimized Hakki–Coleman dielectric resonator.

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Volume

19

ISBN/ISSN

1557-1947

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Issue

7-8

Pages Count

7

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Publisher

Springer

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DOI

10.1007/s10948-006-0129-z