Simplified method for measurements and calculations of coupling coefficients and Q^o factor of high-temperature superconducting dielectric resonators
Journal Publication ResearchOnline@JCUAbstract
To accurately determine the surface resistance of high temperature superconducting films, multi-frequency measurements of S^21, S^11 and S^22 and sophisticated data processing are required. As a result, surface resistance measurements and calculations for varying temperatures are very time consuming. In this paper we introduce a simplified method for calculations of the unloaded Q (Q^0) factor, which require measurements of s^11 and s^22 at the lowest temperature only. For all other temperatures s^21 measurements are needed only. The method has shown to give sufficiently accurate Q^0 values, and hence the surface resistance of superconducting samples, as compared to results obtained from S^21, S^11 and S^22 measurements using the transmission mode q-factor technique. The presented method has been tested under different coupling coefficients and frequencies.
Journal
IEEE Transactions on Microwave Theory and Techniques
Publication Name
IEEE Transactions on Microwave Theory and Techniques
Volume
49
ISBN/ISSN
1557-9670
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Issue
12
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